October 31 – November 1, 2018Minneapolis Convention CenterMinneapolis, MN

TopMap Pro.Surf

The Polytec TopMap Pro.Surf employs white light interferometry as the basis for acquiring surface information. This is translated into images and numbers helping users understand the quality of the components to assess performance and functionality. Flatness, step-height, parallelism and waviness are some of the results. The tele-centric design facilitates measuring into deep holes and also acquiring data to the edge of the recessed surface (no-clipping). With no microscope objectives to contend with, the risk for crash is eliminated. The system can measure 43mm X 32mm in a single field of view (without stitching) and surfaces that are recessed up to 70mm.

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